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VIRTUAL EXPERIENCE
Presented by Alex T. Lau
Overview of the normal distribution and standard deviation concepts
Repeatability, reproducibility, and Site (system) Precision
Various forms of Bias
Site Expected Value (SEV) & Accepted Reference Value (ARV)
Bias assessment for a laboratory
Alex T. Lau, President of TCL-Consulting and Chairman of ASTM D02.94 Subcommittee on Quality Assurance and Statistics, to present his Introductory Training Course on Understanding Test Method Precision, Bias, and SQC Charts.
Precision Fundamentals
- Overview of the Normal distribution and standard deviation concepts
- Provide simple explanation on the meaning of test method repeatability (r), reproducibility (R), and site (system) precision (R')
- How r & R are estimated using ILS
- How r & R information is presented in test methods
- Simple applications of r, R, R'
Bias Fundamentals
- Various forms of Bias
- Site Expected Value (SEV) & Accepted Reference Value (ARV)
- Bias assessment for a laboratory
In-Statistical-Control Fundamentals
- Basic statistical theory, concept, and work process for test method statistical control charts
- Demo of control chart work process execution (Stage 1,2) using QC/PLUS
Who should attend?
- Lab technicians
- Lab QA/QC personnel
- Lab managers
- Personnel involved with product quality assurance and regulatory compliance testing
Cost is $0 per person.